• Editors' Suggestion

Embedded topological insulators

Thomas I. Tuegel, Victor Chua, and Taylor L. Hughes
Phys. Rev. B 100, 115126 – Published 12 September 2019

Abstract

We present a generalization of free-fermionic topological insulators that are composed of topological subsystems of differing dimensionality. These topological subsystems of nonzero codimension are embedded within a trivial insulating environment. A general procedure is described to isolate and classify such embedded topological insulators and we present three representative examples in varying dimensions and symmetry classes. Moreover, we demonstrate with concrete examples that the presence of periodically placed embedded topological insulators in an otherwise trivially classified system can lead to topologically nontrivial physical phenomena on crystalline defects, namely, topological surface/edge modes at stacking faults and partial edge dislocations.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
14 More
  • Received 16 May 2018
  • Revised 6 February 2019

DOI:https://doi.org/10.1103/PhysRevB.100.115126

©2019 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Thomas I. Tuegel1, Victor Chua2, and Taylor L. Hughes1

  • 1Department of Physics, and Institute for Condensed Matter Theory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA
  • 2Department of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, Switzerland

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 100, Iss. 11 — 15 September 2019

Reuse & Permissions
Access Options
CHORUS

Article Available via CHORUS

Download Accepted Manuscript
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×