Abstract
The geometries, formation energies, and diffusion barriers of carbon point defects in silica (α-quartz) have been calculated using a charge-self-consistent density-functional based nonorthogonal tight-binding method. It is found that bonded interstitial carbon configurations have significantly lower formation energies (on the order of 5 eV) than substitutionals. The activation energy of atomic C diffusion via trapping and detrapping in interstitial positions is about 2.7 eV. Extraction of a CO molecule requires an activation energy but the CO molecule can diffuse with an activation energy Retrapping in oxygen vacancies is hindered—unlike for a barrier of about 2 eV.
- Received 11 April 2001
DOI:https://doi.org/10.1103/PhysRevB.64.085333
©2001 American Physical Society