Experimental evidence for an Ehrlich-Schwoebel effect on Si(111)

Andrés Saúl, Jean-Jacques Métois, and Alain Ranguis
Phys. Rev. B 65, 075409 – Published 22 January 2002
PDFExport Citation

Abstract

We have used reflection electron microscopy to study (1) the drift velocity of positive monolayer islands on Si(111) under near equilibrium conditions and direct current (dc) heating and (2) the difference between the velocity of monoatomic steps heated by direct current in the step-up and step-down direction under free sublimation. Our results obtained at around 1200°C show that the islands move in the opposite direction of the dc and the step velocity for ascending steps with respect to the dc direction is smaller than the velocity for opposite steps with the same interstep distance. These two experimental results are a clear qualitative prove of the existence of an Ehrlich-Schwoebel effect on Si(111). We analyze the experimental results for the step dynamics within a modified Burton, Cabrera, and Frank model. We find that a quantitative agreement between the model and the experimental results needs an enhanced effect of the electric field on the diffusion species.

  • Received 24 July 2001

DOI:https://doi.org/10.1103/PhysRevB.65.075409

©2002 American Physical Society

Authors & Affiliations

Andrés Saúl, Jean-Jacques Métois, and Alain Ranguis

  • Centre de Recherche sur les Mécanismes de la Croissance Cristalline, CNRS, Campus de Luminy, Case 913, 13288 Marseille Cedex 9, France

References (Subscription Required)

Click to Expand
Issue

Vol. 65, Iss. 7 — 15 February 2002

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×