Sacrificial Tamper Slows Down Sample Explosion in FLASH Diffraction Experiments

Stefan P. Hau-Riege, Sébastien Boutet, Anton Barty, Saša Bajt, Michael J. Bogan, Matthias Frank, Jakob Andreasson, Bianca Iwan, M. Marvin Seibert, Janos Hajdu, Anne Sakdinawat, Joachim Schulz, Rolf Treusch, and Henry N. Chapman

Phys. Rev. Lett. 104, 064801 – Published 12 February 2010

Abstract

Intense and ultrashort x-ray pulses from free-electron lasers open up the possibility for near-atomic resolution imaging without the need for crystallization. Such experiments require high photon fluences and pulses shorter than the time to destroy the sample. We describe results with a new femtosecond pump-probe diffraction technique employing coherent 0.1 keV x rays from the FLASH soft x-ray free-electron laser. We show that the lifetime of a nanostructured sample can be extended to several picoseconds by a tamper layer to dampen and quench the sample explosion, making $< 1 nm$ resolution imaging feasible.

Received 16 November 2009

DOI:https://doi.org/10.1103/PhysRevLett.104.064801

Authors & Affiliations

Stefan P. Hau-Riege^1,*, Sébastien Boutet², Anton Barty^1,6, Saša Bajt³, Michael J. Bogan², Matthias Frank¹, Jakob Andreasson⁴, Bianca Iwan⁴, M. Marvin Seibert⁴, Janos Hajdu⁴, Anne Sakdinawat⁵, Joachim Schulz⁶, Rolf Treusch³, and Henry N. Chapman^6,7

¹Lawrence Livermore National Laboratory, 7000 East Avenue, Livermore, California, 94550, USA
²SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025, USA
³HASYLAB, Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany
⁴Laboratory of Molecular Biophysics, Department of Cell and Molecular Biology, Uppsala University, Husargatan 3, Box 596, SE-75124 Uppsala, Sweden
⁵University of California, Berkeley, 253 Cory Hall, Berkeley, California 94720, USA
⁶Center for Free Electron Laser Science, DESY, Notkestraße 85, 22607 Hamburg, Germany
⁷Universität Hamburg, Luruper Chaussee 149, 22761 Hamburg, Germany

^*Corresponding author. hauriege1@llnl.gov

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Vol. 104, Iss. 6 — 12 February 2010

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