Electron Exchange Energy in Si Inversion Layers

Frank Stern
Phys. Rev. Lett. 30, 278 – Published 12 February 1973
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Abstract

The exchange energy is found for electrons in a two-dimensional system and in Si inversion layers which are dynamically two dimensional. We find that exchange lowers the energy of the lowest sub-band in Si inversion layers significantly, but affects the energies of higher sub-bands and the spatial extent of the wave functions in the direction perpendicular to the surface only slightly.

  • Received 7 December 1972

DOI:https://doi.org/10.1103/PhysRevLett.30.278

©1973 American Physical Society

Authors & Affiliations

Frank Stern

  • IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598

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Issue

Vol. 30, Iss. 7 — 12 February 1973

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