Dynamics and memory effects in rupture of thermal fuse networks

Didier Sornette and Christian Vanneste
Phys. Rev. Lett. 68, 612 – Published 3 February 1992
PDFExport Citation

Abstract

A simple dynamical generalization of the electrical random fuse model for rupture in random media is introduced in which fuses are heated locally by a generalized Joule effect. When their temperature reaches a given threshold, the fuses burn out irreversibly and become insulators. In one limit, the rupture dynamics is spontaneously attracted to the critical state of the bond percolation model. In another limit, it recovers the ‘‘static’’ random fuse model previously studied in the literature. In between these two extremes, the existence of a novel dynamical memory effect produces a rich phenomenology of fractal rupture patterns, which are sensitively dependent upon the input current.

  • Received 30 September 1991

DOI:https://doi.org/10.1103/PhysRevLett.68.612

©1992 American Physical Society

Authors & Affiliations

Didier Sornette and Christian Vanneste

  • Laboratoire de Physique de la Matière Condensée, Université de Nice(enSophia Antipolis, Parc Valrose, 06034 Nice CEDEX, France

References (Subscription Required)

Click to Expand
Issue

Vol. 68, Iss. 5 — 3 February 1992

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×