1 January 2002 Measurement of the characteristics of a quandrant avalanche photo-diode application to a laser tracking system
Masahiro Toyoda, Kenichi Araki, Yoshiaki Suzuki
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We measured the characteristics of a quadrant-type avalanche photodiode (APD). Its transition region between the adjacent cells had a narrow width of 35 ?m. As the multiplication factor of the quadrant APD was limited by the variety of that among the quadrant cells, the maximum multiplication factor was about 30. We investigated the performance on applying the quadrant APD to a laser tracking system. A noise- equivalent angle of less than 1 ?rad (rms) was achieved at a received optical power of more than 4 pW. The quadrant APD compared favorably with a photodiode quadrant detector when the received power was less than 100 pW.
©(2002) Society of Photo-Optical Instrumentation Engineers (SPIE)
Masahiro Toyoda, Kenichi Araki, and Yoshiaki Suzuki "Measurement of the characteristics of a quandrant avalanche photo-diode application to a laser tracking system," Optical Engineering 41(1), (1 January 2002). https://doi.org/10.1117/1.1418222
Published: 1 January 2002
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Cited by 28 scholarly publications and 1 patent.
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KEYWORDS
Avalanche photodetectors

Signal to noise ratio

Laser systems engineering

Photodiodes

Sensors

Avalanche photodiodes

Optical tracking

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