Paper
26 May 2011 Impedance measurement of quartz crystal based on network analysis method
Guili Liu, Zhengjie Dong, Dong Li, Yanlin Wang
Author Affiliations +
Proceedings Volume 7997, Fourth International Seminar on Modern Cutting and Measurement Engineering; 79972N (2011) https://doi.org/10.1117/12.888541
Event: Fourth International Seminar on Modern Cutting and Measuring Engineering, 2010, Beijing, China
Abstract
A method for the determination of impedance of quartz crystal using automatic network analyzer electrical techniques is introduced in this paper. The vector network analyzer ENA 5070B which is produced by Agilent Company is taken to measure S parameters in short-circuit, open-circuit and crystal-circuit. The algorithm recommended in international standard IEC444-5 is based on theory of two-port S parameter transmission method and relationships between transmission admittance (Y21) and scattering parameters(S parameters). By data analysis, circuit symmetry is good. And around the resonance frequency, amplitude and phase of S parameters have obvious display the crystal characteristics. The phase is not zero on the resonance frequency because of lead inductance and parasitic capacity. The amplitude/phase-frequency curve of crystal impedance, which is in conformity with the stimulation of the crystal model, is achieved. By de-embedding process, high accuracy of series resonant frequency and the impedance around it are measured. Results have created favorable conditions for precisely determining the values of the electrical parameters of quartz crystal units.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Guili Liu, Zhengjie Dong, Dong Li, and Yanlin Wang "Impedance measurement of quartz crystal based on network analysis method", Proc. SPIE 7997, Fourth International Seminar on Modern Cutting and Measurement Engineering, 79972N (26 May 2011); https://doi.org/10.1117/12.888541
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Cited by 3 scholarly publications.
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