A single-shot intensity-position monitor for hard x-ray FEL sources

Yiping Feng; Jan M Feldkamp; David M. Fritz; Marco Cammarata; Robert Aymeric; Chiara Caronna; Henrik T. Lemke; Diling Zhu; Sooheyong Lee; Sebastien Boutet; Garth Williams; Kensuke Tono; Makina Yabashi; Jerome B. Hastings

doi:10.1117/12.893740

5 October 2011 A single-shot intensity-position monitor for hard x-ray FEL sources

Yiping Feng, Jan M Feldkamp, David M. Fritz, Marco Cammarata, Robert Aymeric, Chiara Caronna, Henrik T. Lemke, Diling Zhu, Sooheyong Lee, Sebastien Boutet, Garth Williams, Kensuke Tono, Makina Yabashi, Jerome B. Hastings

Author Affiliations +

Proceedings Volume 8140, X-ray Lasers and Coherent X-ray Sources: Development and Applications IX; 81400Q (2011) https://doi.org/10.1117/12.893740
Event: SPIE Optical Engineering + Applications, 2011, San Diego, California, United States

Abstract

An inline diagnostics device was developed to measure the intrinsic shot-to-shot intensity and position fluctuations of the SASE-based LCLS hard X-ray FEL source. The device is based on the detection of back-scattered X-rays from a partially-transmissive thin target using a quadrant X-ray diode array. This intensity and position monitor was tested for the first time with FEL X-rays on the XPP instrument of the LCLS. Performance analyses showed that the relative precision for intensity measurements approached 0.1% and the position sensitivity was better than 5 μm, limited only by the Poisson statistics of the X-rays collected in a single shot.

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Yiping Feng, Jan M Feldkamp, David M. Fritz, Marco Cammarata, Robert Aymeric, Chiara Caronna, Henrik T. Lemke, Diling Zhu, Sooheyong Lee, Sebastien Boutet, Garth Williams, Kensuke Tono, Makina Yabashi, and Jerome B. Hastings "A single-shot intensity-position monitor for hard x-ray FEL sources", Proc. SPIE 8140, X-ray Lasers and Coherent X-ray Sources: Development and Applications IX, 81400Q (5 October 2011); https://doi.org/10.1117/12.893740

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