Preparation of SERS Substrates for the Detection of Organic Molecules at Low Concentration

Tran Thi Kim Chi, Nguyen Thi Le, Bui Thi Thu Hien, Dang Quoc Trung, Nguyen Quang Liem
Author affiliations

Authors

  • Tran Thi Kim Chi Institute of Materials Science
  • Nguyen Thi Le Cao Bang Teachers’ Trainning College, De Tham, Cao Bang, Viet Nam
  • Bui Thi Thu Hien Institute of Materials Science, Vietnam Academy of Science and Technology 18 Hoang Quoc Viet, Cau Giay, Hanoi, Vietnam
  • Dang Quoc Trung Institute of Materials Science, Vietnam Academy of Science and Technology 18 Hoang Quoc Viet, Cau Giay, Hanoi, Vietnam
  • Nguyen Quang Liem Institute of Materials Science, Vietnam Academy of Science and Technology 18 Hoang Quoc Viet, Cau Giay, Hanoi, Vietnam

DOI:

https://doi.org/10.15625/0868-3166/26/3/8053

Keywords:

SERS, chemical etching, Raman, malachite green

Abstract

In this paper, we present the results of the preparation of Surface Enhanced Raman Spectroscopy (SERS) substrates by depositing silver nanoparticles (Ag NPs) onto a porous silicon wafer that is produced by the chemical etching process. The influences of the preparation parameters such as resistivity of the silicon wafer, the anodizing current density, etching time to the size of pores were systematically investigated. The SERS substrates prepared were characterised by using appropriate techniques: the morphology and pores size by scanning electron microscope (SEM), the SERS activity by Raman scattering measure of organic molecules malachite green (MG) embedded into the substrate at room temperature. Our experimental results show that a home-made Raman microscope system could be efficiently used to detect the MG molecules at the concentration lower than 10-7 M with the prepared SERS substrates which have Ag NPs in the obtained pores of 10 – 40 nm.

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Published

20-01-2017

How to Cite

[1]
T. T. K. Chi, N. T. Le, B. T. T. Hien, D. Q. Trung, and N. Q. Liem, “Preparation of SERS Substrates for the Detection of Organic Molecules at Low Concentration”, Comm. Phys., vol. 26, no. 3, p. 261, Jan. 2017.

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Papers
Received 04-04-2016
Accepted 22-11-2016
Published 20-01-2017