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Crystallite Size Determination of MgO Nanopowder from X-Ray Diffraction Patterns Registered in GIXD Technique

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Abstract:

The problem of the crystallite size determination for nanomaterials from X-ray diffraction data obtained in asymmetrical GIXD geometry was analyzed. The studies were performed on nanocrystalline MgO powder prepared by sol-gel synthesis. The nanopowder was preliminary characterized from X-ray diffraction pattern registered in classical Bragg-Brentano geometry and electron microscope observation. The estimated crystallite size, calculated form Williamson-Hall method, equals to 5 nm whereas the lattice distortion is negligible (0.1%). The X-ray diffraction patterns were registered in 30-135º 2θ range using tunnel GIXD technique for the incident α angle: 0.25; 0.5; 1; 2.5 and 5 degrees, respectively. Additional broadening of diffraction lines originated from applied geometry was observed. The calculated crystallite size deviate significantly in comparison to results obtained from classical Bragg-Brentano data. Corrections for additional line broadening were determined, which should be applied for accurate crystallite size calculation in studies of thin nanocrystalline layers using GIXD technique.

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Periodical:

Solid State Phenomena (Volume 163)

Pages:

177-182

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.163.177

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Online since:

June 2010

Authors:

Tomasz Goryczka, Grzegorz Dercz, Krystian Prusik, Lucjan Pająk, Eugeniusz Łągiewka

Keywords:

GIXD, MgO, Nanocrystalline Material, Rietveld Refinement, X-Ray Diffraction (XRD)

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