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Measurement of the Nanoscale Roughness by Atomic Force Microscopy: Basic Principles and Applications

Written By

R.R.L. De Oliveira, D.A.C. Albuquerque, T.G.S. Cruz, F.M. Yamaji and F.L. Leite

Submitted: 06 June 2011 Published: 23 March 2012

DOI: 10.5772/37583

From the Edited Volume

Atomic Force Microscopy - Imaging, Measuring and Manipulating Surfaces at the Atomic Scale

Edited by Victor Bellitto

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Written By

R.R.L. De Oliveira, D.A.C. Albuquerque, T.G.S. Cruz, F.M. Yamaji and F.L. Leite

Submitted: 06 June 2011 Published: 23 March 2012